Product search:

TIME5100 Portable Leeb Hardness Tester

About Us

Welcome to
Get better

Thickness TestersThickness PartsHardness TestersHardness PartsFlaw DetectorsRoughness TestersRoughness PartsDigital Multimeters

Call 905-669-1663


Home > Products > Hardness Tester >

TIME5100 All-in-One Handheld Leeb Hardness Tester Kit (former TH170)

The new design of TIME5100 with higher quality and more ergonomic handling, together with many advanced features, makes it a competitive and top-contender rebound hardness tester on the market.

Main Features:

  • USB communication interface to transfer the data
  • Automatic identification of Impact test direction
  • Memory of 270 average test results in 9 group files
  • Upper and lower limit setup
  • Automatic switch off
  • Backlight for convenient use in darkness
  • Software calibration
  • Battery capacity display
  • Use of two convenient AAA 1.5V batteries
  • DataView software available

Technical Data:

  • Measuring accuracy: +/- 0.5%
  • Impact device: D type - Integrated
  • Hardness measurement values include HLD, HRC, HRB, HB, HV, and HS
  • Automatic calculation of average and mean test values
  • Storage capacity: 270 average readings in 9 group files
  • USB 2.0 interface
  • Impact direction: 360 degree
  • Minimum Surface Roughness of Sample: 1.6 um ( Ra)
  • Maximum workpiece hardness: 955HV
  • Min. radius of Workpiece
    (convex/concave) Rmin = 50mm (with support ring Rmin= 10mm)
  • Minimum sample weight: 2 ~ 5kg on solid support
  • Continuous working time: 150 h (without backlight)
  • Power: AAA 1.5V batteries (2pcs)
  • Operating Temperature: 0 ~ 40 C
  • Impact energy: 8 ft-lbs (11Nmm)
  • Test tip: Tungsten Carbide
  • Dimensions: 155mm X 55mm X 25mm
  • Weight: 166 g

Standard Configuration:

  • Main TIME5100 unit integrated with impact device (D type probe)
  • Test block in HLD value
  • 2 X AAA Batteries
  • D6a Support ring
  • Cleaning brush
  • Carrying case
  • Certificate from TIME


© 2016 Digiwork Instruments, All Rights Reserved.